Courses

You are invited to attend our Web Seminar "Reliability Assurance Analysis Using S-PLUS Improves Product Design Decisions For Leading Manufacturers" presented by Dr. William Q. Meeker, Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences, Iowa State University.

Date: December 10, 2003
Time: 11:00AM EST/10:00AM CST/8:00AM PST

More information:
www.insightful.com/news_events/webcasts/gen03/meeker.asp

Reliability assurance processes in manufacturing industries require data-driven information for making product-design decisions. Life tests, accelerated life tests, and accelerated degradation tests are commonly used to collect reliability data. Data from products in the field provide another important source of useful reliability information. Due to complications like censoring, these reliability studies typically yield data that require special statistical methods. This presentation will describe the analyses of five different life data analysis applications in the area of product reliability. Methods used in the analyses include Weibull and lognormal analysis, analysis of data with multiple failure modes, accelerated test analysis, and the analysis of recurrence data from repairable systems. SPLIDA, a library for S-PLUS created by the presenter, will be used for the analysis, and information on how to obtain SPLIDA will be provided during the presentation.

Also, David Smith, Product Manager at Insightful Corporation, will share the exciting new features in S-PLUS 6.2!

Register at:
www.insightful.com/news_events/webcasts/gen03/meeker.asp or contact me directly at 800.569.0123 x348 or jmartin@insightful.com.